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Combined spectral and histogram analysis for fast ADC testing.

António Manuel da Cruz SerraManuel Fonseca da SilvaPedro M. RamosRaul Carneiro MartinsLinus MichaeliJán Saliga
Published in: IEEE Trans. Instrum. Meas. (2005)
Keyphrases
  • histogram analysis
  • color space
  • chi square test
  • test cases
  • neural network
  • input image
  • pixel values
  • statistical tests
  • multispectral images
  • hyperspectral images