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On Enhancing Reliability of Weak PUFs via Intelligent Post-Silicon Accelerated Aging.

Md. Nazmul IslamVinay C. PatilSandip Kundu
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2018)
Keyphrases
  • software aging
  • intelligent systems
  • low cost
  • databases
  • computer vision
  • three dimensional
  • high speed
  • agent technology
  • adaptive systems
  • highly reliable
  • application server
  • age estimation
  • reliability analysis