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On Enhancing Reliability of Weak PUFs via Intelligent Post-Silicon Accelerated Aging.
Md. Nazmul Islam
Vinay C. Patil
Sandip Kundu
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2018)
Keyphrases
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software aging
intelligent systems
low cost
databases
computer vision
three dimensional
high speed
agent technology
adaptive systems
highly reliable
application server
age estimation
reliability analysis