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Characterization of the Frequency Dependence of the AC Resistors Used in the Quadrature Bridge of the BIPM.

J. Angel MorenoPierre GournayBenjamin RollandNorihiko Sakamoto
Published in: IEEE Trans. Instrum. Meas. (2021)
Keyphrases
  • real time
  • data streams
  • rotation invariant
  • reliability assessment
  • data sets
  • face recognition
  • multiscale
  • multiresolution
  • texture analysis
  • integrated circuit
  • dependence structure
  • amplitude modulation