Pierre Gournay

Publication Activity (10 Years)

Years Active: 2005-2023
Publications (10 Years): 3

Top Topics

Room Temperature

Top Venues

IEEE Trans. Instrum. Meas.

Publications

Atasi Chatterjee, Mattias Kruskopf, Martin Götz, Yefei Yin, Eckart Pesel, Pierre Gournay, Benjamin Rolland, Jan Kucera, Stephan Bauer, Klaus Pierz, Bernhard Schumacher, Hansjörg Scherer
Performance and Stability Assessment of Graphene-Based Quantum Hall Devices for Resistance Metrology. IEEE Trans. Instrum. Meas. 72 (2023)
J. Angel Moreno, Pierre Gournay, Benjamin Rolland, Norihiko Sakamoto
Characterization of the Frequency Dependence of the AC Resistors Used in the Quadrature Bridge of the BIPM. IEEE Trans. Instrum. Meas. 70 (2021)
Alexandre Satrapinski, Martin Götz, Eckart Pesel, Nick E. Fletcher, Pierre Gournay, Benjamin Rolland
New Generation of Low-Frequency Current Comparators Operated at Room Temperature. IEEE Trans. Instrum. Meas. 66 (6) (2017)
Edwin R. Williams, Darine Haddad, Gérard Genevès, Pierre Gournay, Christian Hauck, François Villar, Richard L. Steiner, Ruimin Liu
Balance Pan Damping Using Rings of Tuned Sloshing Liquids. IEEE Trans. Instrum. Meas. 58 (4) (2009)
François-Xavier Malétras, Pierre Gournay, Ian A. Robinson, Gérard Genevès
A Bias Source for Dynamic Voltage Measurements With a Programmable Josephson Junction Array. IEEE Trans. Instrum. Meas. 56 (2) (2007)
Pierre Gournay, Gérard Genevès, Francisco Alves, Mondher Besbes, François Villar, J. David
Magnetic circuit design for the BNM Watt balance experiment. IEEE Trans. Instrum. Meas. 54 (2) (2005)
Richard L. Steiner, David B. Newell, Edwin R. Williams, Ruimin Liu, Pierre Gournay
The NIST project for the electronic realization of the kilogram. IEEE Trans. Instrum. Meas. 54 (2) (2005)
Gérard Genevès, Pierre Gournay, A. Gosset, M. Lecollinet, François Villar, Patrick Pinot, Patrick Juncar, André Clairon, Arnaud Landragin, David Holleville, Franck Pereira Dos Santos, J. David, Mondher Besbes, Francisco Alves, Luc Chassagne, Suat Topçu
The BNM Watt balance project. IEEE Trans. Instrum. Meas. 54 (2) (2005)