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A Bias Source for Dynamic Voltage Measurements With a Programmable Josephson Junction Array.

François-Xavier MalétrasPierre GournayIan A. RobinsonGérard Genevès
Published in: IEEE Trans. Instrum. Meas. (2007)
Keyphrases
  • low cost
  • real time
  • general purpose
  • dynamic environments
  • electrical properties
  • machine learning
  • wireless sensor networks