Superior performance and Hot Carrier reliability of Strained FDSOI nMOSFETs for advanced CMOS technology nodes.
G. BesnardXavier GarrosFrançois AndrieuP. NguyenW. van den DaeleP. ReynaudWalter SchwarzenbachD. DelpratKonstantin BourdelleGilles ReimboldSorin CristoloveanuPublished in: ESSDERC (2014)