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Superior performance and Hot Carrier reliability of Strained FDSOI nMOSFETs for advanced CMOS technology nodes.

G. BesnardXavier GarrosFrançois AndrieuP. NguyenW. van den DaeleP. ReynaudWalter SchwarzenbachD. DelpratKonstantin BourdelleGilles ReimboldSorin Cristoloveanu
Published in: ESSDERC (2014)
Keyphrases
  • cmos technology
  • low power
  • spl times
  • power consumption
  • low voltage
  • parallel processing
  • power dissipation
  • hidden markov models
  • digital images
  • low cost
  • shortest path
  • spatially varying