Automatic Test Generation for Energy Consumption of Embedded Systems Modeled in EAST-ADL.
Raluca MarinescuEduard Paul EnoiuCristina SeceleanuDaniel SundmarkPublished in: ICST Workshops (2017)
Keyphrases
- energy consumption
- embedded systems
- test generation
- wireless sensor networks
- energy efficiency
- low cost
- energy efficient
- energy saving
- sensor networks
- energy conservation
- data transmission
- test cases
- base station
- smart home
- software systems
- routing protocol
- power management
- data center
- resource constrained
- static analysis
- residual energy
- software testing
- sensor nodes
- quality assurance
- total energy
- database systems
- data sets
- routing algorithm
- image quality
- software engineering
- real time