Reliability Analysis by Charge Migration of 3D SONOS Flash Memory.
Jun-Kyo JeongJae-Young SungHee-Hun YangHi-Deok LeeGa Won LeePublished in: IRPS (2020)
Keyphrases
- reliability analysis
- flash memory
- garbage collection
- file system
- buffer management
- random access
- solid state
- main memory
- embedded systems
- disk drives
- b tree
- database systems
- data storage
- small size
- hand held devices
- storage systems
- storage devices
- condition monitoring
- data structure
- optimization model
- database
- decision support system
- neural network
- databases