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Meeting the Test Challenges of the 1 Gbps Parallel RapidIO Interface with New Automatic Test Equipment Capabilities.
Darren Aaberge
Ken Mockler
Dieu Van Dinh
Raoul Belleau
Tim Donovan
Reid Hewlitt
Published in:
VTS (2005)
Keyphrases
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information retrieval
computer vision
image processing
semi automatic
real time
data sets
information systems
test cases
test data
statistical significance