Useless Memory Allocation in System-on-a-Chip Test: Problems and Solutions.
Paul Theo GonciariBashir M. Al-HashimiNicola NicoliciPublished in: VTS (2002)
Keyphrases
- test problems
- solution quality
- benchmark problems
- test instances
- multi objective optimization problems
- branch and bound algorithm
- simulated annealing
- multi objective evolutionary algorithms
- optimization problems
- tabu search
- feasible solution
- knapsack problem
- optimal solution
- test functions
- multi objective problems
- computational efficiency
- high speed
- pareto fronts
- nsga ii
- low cost
- multi objective differential evolution
- single chip
- multi objective
- objective function
- high density
- genetic algorithm
- efficient solutions
- multiple objectives
- particle swarm optimization
- training data
- learning algorithm