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Experimental measurements and 3D simulation of the parasitic lateral bipolar transistor triggering within a single finger gg-nMOS under ESD.
Philippe Galy
V. Berland
A. Guilhaume
F. Blanc
J. P. Chante
Published in:
Microelectron. Reliab. (2004)
Keyphrases
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high speed
mathematical model
low power
high density
real time
multiscale
probability distribution
numerical simulations