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When IC yield missed the target, who is at fault?

Andreas J. StrojwasMichael CampbellVassilios GerousisJim HoganJohn KibarianMarc LevittWalter NgDipu PramanikMark Templeton
Published in: DAC (2004)
Keyphrases
  • fault diagnosis
  • fault detection
  • data sets
  • artificial intelligence
  • integrated circuit
  • databases
  • website
  • mobile robot
  • target detection
  • neural network
  • case study
  • image sequences
  • bayesian networks
  • multi agent