Sequential Detection of Image Defects for Patterned Fabrics.
Wenzhen WangNa DengBinjie XinPublished in: IEEE Access (2020)
Keyphrases
- image data
- defect detection
- multiscale
- high resolution
- single image
- edge detection
- image analysis
- image content
- input image
- image features
- image representation
- aerial imagery
- detection algorithm
- test images
- template matching
- pixel values
- image pixels
- low level
- image retrieval
- similarity measure
- image classification
- detection method
- segmentation method
- spatial information
- region of interest
- multiresolution
- bounding box
- aerial images
- image processing
- image quality
- feature extraction
- contour extraction
- complex background
- image collections
- digital images
- keypoints
- image database
- image compression