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Influence of Electron-Electron Interaction on Electron Distributions in Short Si-MOSFETs Analysed Using the Local Iterative Monte Carlo Technique.
Torsten Mietzner
Jürgen Jakumeit
Umberto Ravaioli
Published in:
VLSI Design (2001)
Keyphrases
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monte carlo
metal oxide
monte carlo simulation
electron microscopy
markov chain
variance reduction
electric field
monte carlo tree search
importance sampling
global illumination
monte carlo methods
markov decision processes
optimal strategy