An efficient BIST method for non-traditional faults of embedded memory arrays.
Wen-Ben JoneDer-Chen HuangSunil R. DasPublished in: IEEE Trans. Instrum. Meas. (2003)
Keyphrases
- high accuracy
- neural network
- memory usage
- detection method
- clustering method
- computational cost
- computational complexity
- support vector machine svm
- genetic algorithm
- highly efficient
- synthetic data
- learning algorithm
- optimization algorithm
- computationally efficient
- pairwise
- experimental evaluation
- significant improvement
- theoretical analysis
- prior knowledge
- similarity measure
- digital images
- segmentation method
- embedded systems