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Switch-level modeling of transistor-level stuck-at faults.

Peter LidénPeter Dahlgren
Published in: VTS (1995)
Keyphrases
  • high speed
  • higher level
  • levels of abstraction
  • real time
  • artificial intelligence
  • database
  • data sets
  • data mining
  • multiscale
  • fault diagnosis
  • lower level
  • multiple faults