Fair and Comprehensive Benchmarking of Machine Learning Processing Chips.
Geoffrey W. BurrSukHwan LimBoris MurmannRangharajan VenkatesanMarian VerhelstPublished in: IEEE Des. Test (2022)
Keyphrases
- machine learning
- real time
- learning algorithm
- machine learning algorithms
- high speed
- decision trees
- natural language processing
- machine learning methods
- learning systems
- information processing
- data processing
- information extraction
- support vector machine
- pattern recognition
- integrated circuit
- text classification
- knowledge acquisition
- machine learning approaches
- explanation based learning
- computational biology
- high density
- inductive learning
- parallel processing
- high end
- processing elements
- learning problems
- semi supervised learning
- model selection
- knowledge discovery
- active learning
- data analysis
- case study
- feature selection
- computer vision
- real world