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A Method to Generate Tests for Combinational Logic Circuits Using an Ultra-High-Speed Logic Simulator.

Fumiyasu HiroseKoichiro TakayamaNobuaki Kawato
Published in: ITC (1988)
Keyphrases
  • high speed
  • logic circuits
  • low power
  • real time
  • objective function
  • dynamic programming
  • similarity measure
  • regular expressions