Built-In Current Monitor for IDDQ Testing in CMOS 90 nm Technology.

Marcin J. Beresinski Tomasz Borejko Witold A. Pleskacz Viera Stopjaková

Published in: DDECS (2008)

Keyphrases

nm technology
power consumption
real time
high speed
monitoring system
low power
low voltage
power supply
power dissipation
case study
feature vectors
pattern matching
correlation analysis
circuit design