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Parasitic Parameters Impacts Investigation on Soft Error Rate by a Circuit Level Framework.

Weiguang ShengZhongyuan ZhaoZhigang Mao
Published in: PRDC (2015)
Keyphrases
  • error rate
  • equal error rate
  • high speed
  • lower error rates
  • maximum likelihood
  • expectation maximization
  • test set
  • information retrieval
  • computer vision
  • probabilistic model