A Jitter Injection Signal Generation and Extraction System for Embedded Test of High-Speed Data I/O.
Yan LiSteven BielbyAzhar A. ChowdhuryGordon W. RobertsPublished in: J. Electron. Test. (2016)
Keyphrases
- data sets
- high speed
- synthetic data
- data collection
- data processing
- statistical analysis
- data sources
- data analysis
- image data
- original data
- computer systems
- data structure
- data transfer
- original signal
- test data
- data mining techniques
- spatial data
- embedded systems
- statistical tests
- high dimensional data
- database
- denoising
- end users
- prior knowledge
- high quality
- databases
- real time