Device-Free Localization via an Extreme Learning Machine with Parameterized Geometrical Feature Extraction.
Jie ZhangWendong XiaoSen ZhangShoudong HuangPublished in: Sensors (2017)
Keyphrases
- extreme learning machine
- feature extraction
- feedforward neural networks
- support vector regression
- feed forward neural networks
- neural network
- variable selection
- hidden nodes
- gaussian processes
- feature selection
- single layer
- feature space
- pattern recognition
- feature vectors
- pattern classification
- activation function
- back propagation
- dimension reduction
- support vector machine svm
- dimensionality reduction
- support vector machine
- image processing
- multi layer
- principal component analysis
- artificial neural networks
- extracted features
- support vector
- face recognition
- learning algorithm