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Integrated Test-Architecture Optimization and Thermal-Aware Test Scheduling for 3-D SoCs Under Pre-Bond Test-Pin-Count Constraint.

Li JiangQiang XuKrishnendu ChakrabartyT. M. Mak
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2012)
Keyphrases
  • bayesian networks
  • special case
  • optimization problems
  • real time
  • data sets
  • neural network
  • knowledge base
  • search algorithm
  • evolutionary algorithm
  • test data