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Integrated Test-Architecture Optimization and Thermal-Aware Test Scheduling for 3-D SoCs Under Pre-Bond Test-Pin-Count Constraint.
Li Jiang
Qiang Xu
Krishnendu Chakrabarty
T. M. Mak
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2012)
Keyphrases
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bayesian networks
special case
optimization problems
real time
data sets
neural network
knowledge base
search algorithm
evolutionary algorithm
test data