Login / Signup

Connecting RRAM performance to the properties of the hafnia-based dielectrics.

Gennadi BersukerBrian ButcherDavid GilmerPaul KirschLuca LarcherAndrea Padovani
Published in: ESSDERC (2013)
Keyphrases
  • computer vision
  • desirable properties
  • database
  • similarity measure
  • wide range
  • computational complexity
  • data analysis