Telepresence for In-situ Microscopy.

Bahram Parvin John R. Taylor Brian Crowley L. Wu William E. Johnston D. Owen M. A. O'Keefe Ulrich Dahman

Published in: ICMCS (1996)

Keyphrases

virtual reality
virtual environment
autonomous navigation
field of view
image analysis
high throughput
high resolution
multi user
electron microscopy
fluorescence microscopy
microscopy images
confocal images
support vector
image stacks
data sets
human operators
preprocessing
high quality
machine learning