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Reliability challenges in the nanoelectronics era.

A. J. van RoosmalenG. Q. Zhang
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • lessons learned
  • key issues
  • real world
  • software engineering
  • big data
  • reliability analysis
  • data sets
  • neural network
  • e learning
  • image segmentation
  • three dimensional
  • technical challenges
  • highly reliable