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Moiré Techniques Based on Memory Function of Laser Scanning Microscope for Deformation Measurement at Micron/Submicron Scales.
Qinghua Wang
Hiroshi Tsuda
Satoshi Kishimoto
Yoshihisa Tanaka
Yutaka Kagawa
Published in:
Int. J. Autom. Technol. (2015)
Keyphrases
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laser scanning
visual inspection
electron beam
three dimensional
volume reconstruction
high resolution
microscopy images
high quality
image analysis
x ray