Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions.

Maximilian Lederer Franz Müller Raik Hoffmann Ricardo Olivo Yannick Raffel Shouzhuo Yang Sourav De Roman Potjan Oliver Ostien Abdelrahman Altawil Ayse Sünbül David Lehninger Thomas Kämpfe Konrad Seidel

Published in: IMW (2024)

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