On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs.
Eddy SimoenMarc AoulaicheAnabela VelosoM. JurczakCor ClaeysL. Mendes AlmeidaMaria Glória Caño de AndradeA. Luque RodriguezJ. A. Jimenez TejadaChristian CaillatPierre FazanPublished in: ESSDERC (2012)
Keyphrases
- low frequency
- high frequency
- frequency domain
- wavelet analysis
- wavelet transform
- subband
- wavelet coefficients
- discrete wavelet transform
- frequency band
- low pass
- electromagnetic fields
- visual quality
- high resolution
- high frequency components
- low and high frequency
- fusion rules
- dct domain
- wavelet domain
- multiresolution
- original images
- similarity measure
- feature extraction