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Rethinking Patch Dependence for Masked Autoencoders.

Letian FuLong LianRenhao WangBaifeng ShiXudong WangAdam YalaTrevor DarrellAlexei A. EfrosKen Goldberg
Published in: CoRR (2024)
Keyphrases
  • denoising
  • image patches
  • regular grid
  • databases
  • genetic algorithm
  • technology enhanced learning
  • dependence structure
  • machine learning
  • knowledge base
  • metadata
  • image processing
  • multiscale
  • markov random field