A Fast Characterizing Method for Large Embedded Memory Modules on SoC.
Masahiko OmuraToshiki KanamotoMichiko TsukamotoMitsutoshi ShirotaTakashi NakajimaMasayuki TeraiPublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2007)
Keyphrases
- cost function
- high accuracy
- detection method
- experimental evaluation
- probabilistic model
- synthetic data
- optimization algorithm
- preprocessing
- dynamic programming
- computational cost
- optimization method
- image processing
- fully automatic
- high precision
- support vector machine svm
- mutual information
- edge detection
- wavelet transform
- significant improvement
- data structure