An Efficient Finite Element Method for Submicron IC Capacitance Extraction.
N. P. van der MeijsArjan J. van GenderenPublished in: DAC (1989)
Keyphrases
- finite element method
- numerical simulations
- finite element
- diffuse optical tomography
- numerical solution
- high speed
- numerical methods
- low power
- boundary conditions
- integrated circuit
- temperature field
- boundary element method
- finite element model
- heat transfer
- single image
- linear programming
- vlsi circuits
- medical images