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A Nonparametric Defocus-based Approach to Reconstructing Thin 3D Structures in Optical Sectioning Microscopy.
John P. Kaufhold
William Clement Karl
Published in:
ICIP (2) (1998)
Keyphrases
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physical characteristics
image analysis
motion parallax
image sequences
depth estimation
microscopy images
depth from defocus
fluorescence microscopy
computer vision
high resolution
markov random field
high throughput
kernel density estimation