Oxygen Engineering for Positive Bias Stress Stability of Top-Gated Indium Tin Oxide (ITO) Transistors.
Sumaiya WahidEric PopPublished in: DRC (2024)
Keyphrases
- room temperature
- artificial intelligence
- variance reduction
- positive and negative
- integrated circuit
- engineering problems
- thin film
- computer science
- electron microscopy
- computer aided design
- high density
- magnetic field
- stability analysis
- systems engineering
- engineering education
- mechanical engineering
- engineering design
- circuit design
- engineering students
- transaction costs
- printed circuit boards
- low power
- x ray
- low cost
- software engineering