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Impact of defect on I(V) instabilities observed on Ti/4H-SiC high voltage Schottky diodes.

N. AbdelwahedM. TroudiNabil SghaierAbdelkader Souifi
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • high voltage
  • high density
  • operating conditions
  • normal operation
  • partial discharge
  • decision trees
  • boundary conditions
  • real time
  • fuzzy logic
  • design methodology
  • power supply