Inductance Characterization of Small Interconnects Using Test-Signal Method.

Jeegar Tilak Shah Madhav P. Desai Sugata Sanyal

Published in: VLSI Design (2000)

Keyphrases

significant improvement
support vector machine
computational complexity
prior knowledge
experimental evaluation
support vector machine svm
clustering method
synthetic data
segmentation method
test data
high precision
image processing
training data
computational cost
detection method
power system