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Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET.

Balaji NarasimhamVikas ChaudharyMike SmithLiming TsauDennis BallBharat L. Bhuva
Published in: IRPS (2021)
Keyphrases
  • error rate
  • test set
  • training error
  • lower error rates
  • computer vision
  • rule sets
  • equal error rate
  • decision trees
  • text entry
  • cost sensitive classification