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RMS slope of exponentially correlated surface roughness for radar applications.

Wolfgang Dierking
Published in: IEEE Trans. Geosci. Remote. Sens. (2000)
Keyphrases
  • surface roughness
  • specular reflection
  • curved surfaces
  • manufacturing process
  • signal processing
  • computer vision
  • high resolution
  • epipolar geometry
  • fuzzy inference system