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Techniques for Improved Reliability in Memristive Crossbar PUF Circuits.
Mesbah Uddin
Md. Badruddoja Majumder
Garrett S. Rose
Karsten Beckmann
Harika Manem
Zahiruddin Alamgir
Nathaniel C. Cady
Published in:
ISVLSI (2016)
Keyphrases
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high speed
feature selection
case study
power consumption
data sets
real world
genetic algorithm
image processing
multiscale
relational databases
artificial neural networks
improved algorithm
reliability analysis
analog vlsi