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The impact of electrical current, mechanical bending, and thermal annealing on tin whisker growth.
Yuki Fukuda
Michael D. Osterman
Michael G. Pecht
Published in:
Microelectron. Reliab. (2007)
Keyphrases
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electrical power
low voltage
infrared
electro mechanical
data mining
genetic algorithm
decision trees
multiscale
simulated annealing
power system
path planning
transmission line
printed circuit boards
electrical properties