Statistical process monitoring in the era of smart manufacturing.
Q. Peter HeJin WangPublished in: ACC (2017)
Keyphrases
- statistical analysis
- statistical models
- data driven
- hypothesis testing
- manufacturing systems
- ubiquitous environments
- databases
- manufacturing environment
- manufacturing industry
- semiconductor manufacturing
- statistical measures
- statistical approaches
- smart spaces
- statistical inference
- information theory
- big data
- model selection
- multiscale
- website
- neural network