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A BIST scheme for testing and repair of multi-mode power switches.

Zhaobo ZhangXrysovalantis KavousianosYiorgos TsiatouhasKrishnendu Chakrabarty
Published in: IOLTS (2011)
Keyphrases
  • power consumption
  • case study
  • computational complexity
  • learning scheme
  • detection scheme
  • recognition scheme
  • power distribution