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Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors.

Sven KrügerGünther WernickeWolfgang OstenDaniel KayserNazif DemoliHartmut Gruber
Published in: J. Electronic Imaging (2001)
Keyphrases
  • fault detection
  • feature analysis
  • wavelet filters
  • wavelet transform
  • fault diagnosis
  • industrial processes
  • machine learning
  • image processing
  • support vector machine
  • feature space
  • expert systems
  • texture features