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Hopping conduction distance of bipolar switching GdOx resistance random access memory thin films devices modified by different constant compliance current.

Kai-Huang ChenChien-Min ChengCheng-Ying LiShou-Jen Huang
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • thin film
  • short circuit
  • high density
  • random access memory
  • grain size
  • design considerations
  • low voltage
  • knn
  • parallel algorithm
  • silicon nitride