A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides.
Seong-Joon KimTao YuanSuk Joo BaePublished in: IEEE Trans. Reliab. (2016)
Keyphrases
- process model
- spatio temporal
- field effect transistors
- process mining
- leakage current
- business processes
- spatial and temporal
- business process
- image sequences
- high speed
- moving objects
- petri net
- formal models
- software process
- steady state
- high density
- event logs
- workflow management systems
- control flow
- bit rate
- low voltage