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Statistical analysis of subthreshold leakage current for VLSI circuits.
Rajeev R. Rao
Ashish Srivastava
David T. Blaauw
Dennis Sylvester
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2004)
Keyphrases
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vlsi circuits
statistical analysis
leakage current
low voltage
mixed signal
cmos technology
low power
power line
design considerations
power management
silicon dioxide
low cost
real time
computer vision
high speed
power consumption