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Divide-and-Conquer IDDQ Testing for Core-Based System Chips.

C. P. RavikumarRahul Kumar
Published in: VLSI Design (2002)
Keyphrases
  • correlation analysis
  • computer systems
  • test set
  • test cases
  • database
  • data sets
  • learning algorithm
  • information systems
  • image processing
  • multi agent systems
  • integrated circuit
  • selected features
  • high end