: Visualizing Memory Chip Test Data.

Amit P. Sawant Ravi Raina Christopher G. Healey

Published in: ISVC (2) (2007)

Keyphrases

test data
training data
test cases
random access memory
test set
high speed
data sets
training set
memory subsystem
multithreading
training and test data
level parallelism
search based testing
memory access
memory bandwidth
ibm zenterprise
data model
computer vision