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Special Issue on Model-Based Diagnostics.
Peter Struss
Gregory M. Provan
Johan de Kleer
Gautam Biswas
Published in:
IEEE Trans. Syst. Man Cybern. Part A (2010)
Keyphrases
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special issue
international journal
ai edam
applied intelligence
special section
ecml pkdd
expert systems
databases
computer science
artificial neural networks
data driven
condition monitoring