Special Issue on Model-Based Diagnostics.

Peter Struss Gregory M. Provan Johan de Kleer Gautam Biswas

Published in: IEEE Trans. Syst. Man Cybern. Part A (2010)

Keyphrases

special issue
international journal
ai edam
applied intelligence
special section
ecml pkdd
expert systems
databases
computer science
artificial neural networks
data driven
condition monitoring