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Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement.

Mykola BlyzniukIrena KazymyraWieslaw KuzmiczWitold A. PleskaczJaan RaikRaimund Ubar
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • vlsi circuits
  • data analysis
  • low cost
  • image sequences
  • image analysis
  • probabilistic model
  • statistical analysis
  • computing systems